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• ['Lee, G. C.', 'Liang, Z.', 'Song, J. W.', 'Shen, J. D.', 'Liu, W. C.']
  Development of Measurement Capability for Micro-Vibration Evaluations with Application to Chip Fabrication Facilities.
  National Science Foundation, Arlington, VA.; Erie County Industrial Development Agency, Buffalo, NY., December 1, 1999, 146 p.
  Identifying Number(s): MCEER-99-0020
  Keywords: ; Root mean squares; Industrial plants; Earthquake resistant structures; Plant location; Semiconductors; Vibration; Frequency measurement; Integrated circuits; Ground motion; Frequency response testing; Plant layout; Soil structure interactions; Velocity; Seismicity; Chips (Electronics)